A compact model for flicker noise in MOSFETs considering both correlated mobility and carrier number fluctuations
Alfredo Arnaud,Alain HoffmannVolume:
89
Language:
english
Journal:
Analog Integrated Circuits and Signal Processing
DOI:
10.1007/s10470-016-0836-8
Date:
December, 2016
File:
PDF, 1.05 MB
english, 2016