Stability of Electrical Characteristics of MOS Structures Based on Gallium Oxide
V. M. Kalygina,Yu. S. Petrova,I. A. Prudaev,O. P. TolbanovVolume:
59
Language:
english
Journal:
Russian Physics Journal
DOI:
10.1007/s11182-016-0833-5
Date:
October, 2016
File:
PDF, 738 KB
english, 2016