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VCSEL-Based In-Circuit Status-Monitoring and Effects-Diagnosis Method for HPEM Susceptibility Test on Digital Electronic Equipment
Yan, Junkai, Wang, Jianguo, Tang, Chuanxiang, Liu, Xiaolong, Yang, Meng, Hao, Wenxi, He, YanyangYear:
2017
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/TEMC.2017.2703090
File:
PDF, 3.72 MB
english, 2017