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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Methods for Inspection, Characterization, and Imaging of Biomaterials III - Refractive index effect on aberration correction of optical tweezers
Ferraro, Pietro, Grilli, Simonetta, Ritsch-Marte, Monika, Hitzenberger, Christoph K., Birzhandi, Samaneh, Madanipour, Khosro, Shahrabi Farahani, Shahrzad, Ghanbari, SaeedVolume:
10333
Year:
2017
Language:
english
DOI:
10.1117/12.2270154
File:
PDF, 525 KB
english, 2017