SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Optical fiber sensors measurement system and special fibers improvement

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Jelinek, Michal, Hrabina, Jan, Hola, Miroslava, Hucl, Vaclav, Cizek, Martin, Rerucha, Simon, Lazar, Josef, Mikel, Bretislav
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Volume:
10329
Year:
2017
Language:
english
DOI:
10.1117/12.2270251
File:
PDF, 798 KB
english, 2017
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