Influence of the ionization-energy losses of high-energy...

Influence of the ionization-energy losses of high-energy bismuth ions on the development of helium blisters in silicon

V. F. Reutov,S. N. Dmitriev,A. S. Sohatsky,A. G. Zaluzhnyi
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Volume:
49
Language:
english
Journal:
Semiconductors
DOI:
10.1134/S106378261510022X
Date:
October, 2015
File:
PDF, 1.26 MB
english, 2015
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