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Comparison of Critical Current Scaling Behaviors in\(\hbox {MgB}_{2}\)/SiC/Si Thin Films
Akihiko Nishida,Chihiro Taka,Stefan Chromik…Volume:
187
Language:
english
Journal:
Journal of Low Temperature Physics
DOI:
10.1007/s10909-017-1777-z
Date:
June, 2017
File:
PDF, 616 KB
english, 2017