Application of Mie theory and fractal models to determine...

Optical and Quantum Electronics 2017 / 7 Vol. 49; Iss. 7

Application of Mie theory and fractal models to determine the optical and surface roughness of Ag–Cu thin films

Țălu, Ștefan, Yadav, Ram Pratap, Mittal, Ashok Kumar, Achour, Amine, Luna, Carlos, Mardani, Mohsen, Solaymani, Shahram, Arman, Ali, Hafezi, Fatemeh, Ahmadpourian, Azin, Naderi, Sirvan, Saghi, Khalil,
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Volume:
49
Language:
english
Journal:
Optical and Quantum Electronics
DOI:
10.1007/s11082-017-1079-3
Date:
July, 2017
File:
PDF, 1.53 MB
english, 2017
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