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Methodological development of topographic correction in 2D/3D ToF-SIMS images using AFM images
Jung, Seokwon, Lee, Nodo, Choi, Myungshin, Lee, Jungmin, Cho, Eunkyunng, Joo, MinhoLanguage:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2017.05.217
Date:
May, 2017
File:
PDF, 2.12 MB
english, 2017