[IEEE 2016 23rd International Conference on Pattern...

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[IEEE 2016 23rd International Conference on Pattern Recognition (ICPR) - Cancun (2016.12.4-2016.12.8)] 2016 23rd International Conference on Pattern Recognition (ICPR) - Crack detection based on a Marked Point Process model

Vandoni, Jennifer, Le Hegarat-Mascle, Sylvie, Aldea, Emanuel
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Year:
2016
Language:
english
DOI:
10.1109/ICPR.2016.7900249
File:
PDF, 4.20 MB
english, 2016
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