Deep Learning for Infrared Thermal Image Based Machine Health Monitoring
Janssens, Olivier, Van de Walle, Rik, Loccufier, Mia, Van Hoecke, SofieYear:
2017
Language:
english
Journal:
IEEE/ASME Transactions on Mechatronics
DOI:
10.1109/TMECH.2017.2722479
File:
PDF, 3.30 MB
english, 2017