SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Influence of the limited detector size on spatial variations of the reconstruction accuracy in holographic tomography
Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Kostencka, Julianna, Kozacki, Tomasz, Hennelly, Bryan, Sheridan, John T.Volume:
10329
Year:
2017
Language:
english
DOI:
10.1117/12.2270108
File:
PDF, 853 KB
english, 2017