Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2016 / 1 Vol. 10; Iss. 1
![](/img/cover-not-exists.png)
Discrete Fourier analysis of images of structural defects in single crystals
I. A. Zhukovskaya,V. A. Bushuev,V. A. TkalVolume:
10
Language:
english
Journal:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/S1027451015060403
Date:
January, 2016
File:
PDF, 2.43 MB
english, 2016