(Invited) Baseplate Materials for Securing Reliability of Wide Band Gap Power Semiconductor Module Operating at High Temperatures
Takahashi, H., Anzai, T., Kato, F., Sato, S., Tanisawa, H., Murakami, Y., Watanabe, K., Sato, H.Volume:
69
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/06911.0049ecst
Date:
October, 2015
File:
PDF, 2.25 MB
english, 2015