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Method for predicting the effects of radiative relaxation in bipolar integrated circuits
N. N. Panyushkin,N. N. MatveevVolume:
80
Language:
english
Journal:
Bulletin of the Russian Academy of Sciences: Physics
DOI:
10.3103/S1062873816090343
Date:
September, 2016
File:
PDF, 242 KB
english, 2016