Reliability improvement of transistor clamped...

IET Power Electronics 2017 / 06 Vol. 10; Iss. 7

Reliability improvement of transistor clamped H-bridge-based cascaded multilevel inverter

Gautam, Shivam Prakash, Gupta, Shubhrata, Kumar, Lalit
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Volume:
10
Language:
english
Journal:
IET Power Electronics
DOI:
10.1049/iet-pel.2016.0574
Date:
June, 2017
File:
PDF, 12.17 MB
english, 2017
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