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Dynamic strain-induced giant electroresistance and erasing effect in ultrathin ferroelectric tunnel-junction memory
Yau, Hei-Man, Xi, Zhongnan, Chen, Xinxin, Wen, Zheng, Wu, Ge, Dai, Ji-YanVolume:
95
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.95.214304
Date:
June, 2017
File:
PDF, 2.70 MB
english, 2017