[IEEE 2017 IEEE Third International Conference on Multimedia Big Data (BigMM) - Laguna Hills, CA, USA (2017.4.19-2017.4.21)] 2017 IEEE Third International Conference on Multimedia Big Data (BigMM) - Patch Based Semi-supervsied Linear Regression for Single Sample Face Recognition
Liu, Fan, Ding, Yuhua, Yang, Sai, Xu, FengYear:
2017
Language:
english
DOI:
10.1109/bigmm.2017.41
File:
PDF, 185 KB
english, 2017