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SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Optical Pattern Recognition: A Critical Review - Optical scale and rotation-invariant pattern recognition
Sheng, Yunlong, Lejeune, ClaudeVolume:
10262
Year:
2017
Language:
english
DOI:
10.1117/12.59850
File:
PDF, 1.07 MB
english, 2017