Local-stress-induced thermal conductivity anisotropy analysis using non-destructive photo-thermo-mechanical lock-in thermography (PTM-LIT) imaging
Huan, Huiting, Mandelis, Andreas, Liu, Lixian, Melnikov, AlexanderVolume:
91
Language:
english
Journal:
NDT & E International
DOI:
10.1016/j.ndteint.2017.06.008
Date:
October, 2017
File:
PDF, 2.82 MB
english, 2017