[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Investigation of read disturb error in 1Ynm NAND flash memories for system level solution
Kobayashi, Atsuro, Watanabe, Hikaru, Sakaki, Yukiya, Aritome, Seiichi, Takeuchi, KenYear:
2017
Language:
english
DOI:
10.1109/irps.2017.7936388
File:
PDF, 232 KB
english, 2017