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SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Materials Characterization and Optical Probe Techniques: A Critical Review - Ellipsometry as a characterization technique
Truong, Vo-Van, Nguyen, Le-quangVolume:
10291
Year:
2017
Language:
english
DOI:
10.1117/12.279849
File:
PDF, 479 KB
english, 2017