Extension of Stacking Faults in 4H-SiC pn Diodes under a...

Materials Science Forum 2017 / 5 Vol. 897

Extension of Stacking Faults in 4H-SiC pn Diodes under a High Current Pulse Stress

Iwahashi, Yohei, Miyazato, Masaki, Miyajima, Masaaki, Yonezawa, Yoshiyuki, Kato, Tomohisa, Fujiwara, Hirokazu, Hamada, Kimimori, Otsuki, Akihiro, Okumura, Hajime
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Volume:
897
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.897.218
Date:
May, 2017
File:
PDF, 1.17 MB
english, 2017
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