A computer-aided crystal diffraction spectrometer for precision measurements of characteristic X-rays from highly-charged heavy ions
G. Zschornack, G. Musiol, V. Pohl, A. Reichmann, M. SchiekelVolume:
21
Year:
1991
Language:
english
Pages:
1
DOI:
10.1007/bf01426338
File:
PDF, 178 KB
english, 1991