High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEM
House, Stephen D., Chen, Yuxiang, Jin, Rongchao, Yang, Judith C.Volume:
182
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2017.07.004
Date:
November, 2017
File:
PDF, 2.42 MB
english, 2017