[IEEE 2017 IEEE 30th Canadian Conference on Electrical and Computer Engineering (CCECE) - Windsor, ON, Canada (2017.4.30-2017.5.3)] 2017 IEEE 30th Canadian Conference on Electrical and Computer Engineering (CCECE) - A study of capacitor element failures in high voltage Shunt Capacitor Banks
Jouybari-Moghaddam, Hessamoddin, Sidhu, Tarlochan S.Year:
2017
Language:
english
DOI:
10.1109/CCECE.2017.7946675
File:
PDF, 2.95 MB
english, 2017