Time-Dependent Dielectric Breakdown in High-Voltage GaN...

Time-Dependent Dielectric Breakdown in High-Voltage GaN MIS-HEMTs: The Role of Temperature

Warnock, Shireen, Lemus, Allison, Joh, Jungwoo, Krishnan, Srikanth, Pendharkar, Sameer, del Alamo, Jesus A.

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Year:

2017

Language:

english

Journal:

IEEE Transactions on Electron Devices

DOI:

10.1109/TED.2017.2717924

File:

PDF, 1.21 MB

english, 2017

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