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[IEEE 2017 IEEE 30th Canadian Conference on Electrical and Computer Engineering (CCECE) - Windsor, ON, Canada (2017.4.30-2017.5.3)] 2017 IEEE 30th Canadian Conference on Electrical and Computer Engineering (CCECE) - Efficient feature extraction in ultrasonic spot weld inspection
Baradarani, A., Khanli, L. M., Chertov, A. M., Regalado, W. P., Maev, R. Gr.Year:
2017
Language:
english
DOI:
10.1109/CCECE.2017.7946670
File:
PDF, 3.46 MB
english, 2017