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SPIE Proceedings [SPIE SPIE Defense + Security - Anaheim, California, United States (Sunday 9 April 2017)] Anomaly Detection and Imaging with X-Rays (ADIX) II - X-ray coherent scattering tomography of textured material (Conference Presentation)
Ashok, Amit, Franco, Edward D., Gehm, Michael E., Neifeld, Mark A., Zhu, Zheyuan, Pang, ShuoVolume:
10187
Year:
2017
Language:
english
DOI:
10.1117/12.2262029
File:
PDF, 112 KB
english, 2017