[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - Automatic place-and-route of emerging LED-driven wires within a monolithically-integrated CMOS−III-V process
Krishna, Tushar, Balachandran, Arya, Ben Chiah, Siau, Zhang, Li, Wang, Bing, Wang, Cong, Kian, Kenneth Lee Eng, Michel, Jurgen, Peh, Li-ShiuanYear:
2017
Language:
english
DOI:
10.23919/DATE.2017.7927014
File:
PDF, 975 KB
english, 2017