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[IEEE 2017 IEEE 37th International Conference on Electronics and Nanotechnology (ELNANO) - Kyiv, Ukraine (2017.4.18-2017.4.20)] 2017 IEEE 37th International Conference on Electronics and Nanotechnology (ELNANO) - Deformation characteristics of SOI structures at cryogenic temperatures
Druzhinin, A., Khoverko, Yu., Kogut, I., Holota, V.Year:
2017
Language:
english
DOI:
10.1109/ELNANO.2017.7939723
File:
PDF, 816 KB
english, 2017