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[IEEE 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Torino, Italy (2017.5.22-2017.5.25)] 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Measuring the thickness of transparent objects using a confocal displacement sensor
Weng, Chun-Jen, Lu, Bo-Rong, Cheng, Pi-Ying, Hwang, Chi-Hung, Chen, Chih-YenYear:
2017
Language:
english
DOI:
10.1109/I2MTC.2017.7969897
File:
PDF, 578 KB
english, 2017