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[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - A critical re-examination of body-bias on the soft error rate and single-event latch-up in automotive SRAMs
Mahatme, N. N., Min, B., Loiko, K.Year:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936268
File:
PDF, 318 KB
english, 2017