[IEEE 2017 XX IEEE International Conference on Soft...

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[IEEE 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) - Saint Petersburg, Russia (2017.5.24-2017.5.26)] 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) - Development of the interactive systems with fault-tolerant control of complex objects

Shestopalov, M. Yu., Poshekhonov, L. B., Bespalov, A. V., Altshul, S. D., Guzayev, E. V.
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Year:
2017
Language:
english
DOI:
10.1109/SCM.2017.7970535
File:
PDF, 331 KB
english, 2017
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