![](/img/cover-not-exists.png)
A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping
Banaszeski da Silva, Mauricio, Tuinhout, Hans P., Zegers-van Duijnhoven, Adrie, Wirth, Gilson I., Scholten, Andries J.Year:
2017
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2017.2713301
File:
PDF, 1.25 MB
english, 2017