A Compact Model for the Statistics of the Low-Frequency...

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IEEE Transactions on Electron Devices 2017

A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping

Banaszeski da Silva, Mauricio, Tuinhout, Hans P., Zegers-van Duijnhoven, Adrie, Wirth, Gilson I., Scholten, Andries J.
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2017.2713301
File:
PDF, 1.25 MB
english, 2017
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