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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Modeling Aspects in Optical Metrology VI - Role of coherence in microsphere-assisted nanoscopy
Bodermann, Bernd, Frenner, Karsten, Silver, Richard M., Perrin, Stephane, Lecler, Sylvain, Leong-Hoi, Audrey, Montgomery, Paul C.Volume:
10330
Year:
2017
Language:
english
DOI:
10.1117/12.2270246
File:
PDF, 1.50 MB
english, 2017