[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - Fault clustering technique for 3D memory BISR
Li, Tianjian, Han, Yan, Liang, Xiaoyao, Lee, Hsien-Hsin S., Jiang, LiYear:
2017
Language:
english
DOI:
10.23919/DATE.2017.7927050
File:
PDF, 1.92 MB
english, 2017