[IEEE 2017 Design, Automation & Test in Europe...

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[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - Fault clustering technique for 3D memory BISR

Li, Tianjian, Han, Yan, Liang, Xiaoyao, Lee, Hsien-Hsin S., Jiang, Li
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Year:
2017
Language:
english
DOI:
10.23919/DATE.2017.7927050
File:
PDF, 1.92 MB
english, 2017
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