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[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - VAET-STT: A variation aware estimator tool for STT-MRAM based memories
Nair, Sarath Mohanachandran, Bishnoi, Rajendra, Golanbari, Mohammad Saber, Oboril, Fabian, Tahoori, Mehdi B.Year:
2017
Language:
english
DOI:
10.23919/DATE.2017.7927221
File:
PDF, 226 KB
english, 2017