[IEEE 2017 40th International Convention on Information and...

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[IEEE 2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) - Opatija, Croatia (2017.5.22-2017.5.26)] 2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) - Structural integrity optimization of 3D TSV package by analyzing crack behavior at TSV and BEOL

Rahangdale, Unique, Doiphode, Aniruddha, Rajmane, Pavan, Misrak, Abel, Agonafer, Dereje
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Year:
2017
Language:
english
DOI:
10.23919/MIPRO.2017.7966577
File:
PDF, 1.15 MB
english, 2017
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