Phase quantification by X-ray photoemission valence band...

Applied Surface Science 2017 / 11 Vol. 423

Phase quantification by X-ray photoemission valence band analysis applied to mixed phase TiO 2 powders

Breeson, Andrew C., Sankar, Gopinathan, Goh, Gregory K.L., Palgrave, Robert G.
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Volume:
423
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2017.06.161
Date:
November, 2017
File:
PDF, 963 KB
english, 2017
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