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SPIE Proceedings [SPIE SPIE Astronomical Telescopes + Instrumentation - Edinburgh, United Kingdom (Sunday 26 June 2016)] Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VIII - Systematic error mitigation for the PIXIE instrument
Holland, Wayne S., Zmuidzinas, Jonas, Kogut, Alan, Fixsen, Dale J., Nagler, Peter, Tucker, GregoryVolume:
9914
Year:
2016
Language:
english
DOI:
10.1117/12.2231092
File:
PDF, 977 KB
english, 2016