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[IEEE 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Torino, Italy (2017.5.22-2017.5.25)] 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Unbalance fault localization in rotating machinery disks using EEMD and optimized multi-class SVM
Rahbar, Mohammad, Amirkhani, Saeed, Chaibakhsh, Ali, Rahbar, FarazYear:
2017
Language:
english
DOI:
10.1109/I2MTC.2017.7969886
File:
PDF, 834 KB
english, 2017