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[IEEE 2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing (MET) - Buenos Aires, Argentina (2017.5.22-2017.5.22)] 2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing (MET) - A Template-Based Approach to Describing Metamorphic Relations
Segura, Sergio, Duran, Amador, Troya, Javier, Cortes, Antonio RuizYear:
2017
Language:
english
DOI:
10.1109/met.2017.3
File:
PDF, 158 KB
english, 2017