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Surface sensitivity of four-probe STM for the measurement of the resistivity of bulk ZnO correlated to XPS
Lord, Alex Mark, Evans, Jon E, Barnett, Chris, Allen, Martin W, Barron, Andrew R, Wilks, SteveLanguage:
english
Journal:
Journal of Physics: Condensed Matter
DOI:
10.1088/1361-648X/aa7dc8
Date:
July, 2017
File:
PDF, 1.30 MB
english, 2017