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Terahertz Beam Testing of Millimeter Wave Monolithic Integrated Circuits
Rumyantsev, Sergey, Muraviev, Andrey, Rudin, Sergey, Rupper, Greg, Reed, Meredith, Suarez, John, Shur, MichaelYear:
2017
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/JSEN.2017.2725744
File:
PDF, 476 KB
english, 2017