[IEEE 2017 IEEE International Conference on Microelectronic Systems Education (MSE) - Lake Louise, AB, Canada (2017.5.11-2017.5.12)] 2017 IEEE International Conference on Microelectronic Systems Education (MSE) - On-die thermal evaluation system
Parameswaran, Suresh, Balakrishnan, Saravanan, Ang, BoonYear:
2017
Language:
english
DOI:
10.1109/MSE.2017.7945085
File:
PDF, 1.05 MB
english, 2017