[IEEE 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Athens, Greece (2017.4.3-2017.4.5)] 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - FDSOI MOSFET threshold voltage characterization based on AC simulation and measurements
Tomaszewski, Daniel, Gluszko, Grzegorz, Kucharski, Krzysztof, Malesinska, Jolanta, Lukasiak, LidiaYear:
2017
Language:
english
DOI:
10.1109/ULIS.2017.7962568
File:
PDF, 2.54 MB
english, 2017