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[IEEE 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Torino, Italy (2017.5.22-2017.5.25)] 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Sensitivity analysis of influence quantities on signal-to-noise ratio in face-based recognition systems
Betta, G., Capriglione, D., Corvino, M., Liguori, C., Sommella, P.Year:
2017
Language:
english
DOI:
10.1109/I2MTC.2017.7969704
File:
PDF, 455 KB
english, 2017