[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Product-level reliability estimator with budget-based reliability management in 16nm technology
Ahn, Jae-Gyung, Lu, Ming Feng, Navale, Nitin, Graves, Dawn, Refai-Ahmed, Gamal, Yeh, Ping-Chin, Chang, JonathanYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936278
File:
PDF, 1.01 MB
english, 2017