[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Latchup in bulk FinFET technology
Dai, C.-T., Chen, S.-H., Linten, D., Scholz, M., Hellings, G., Boschke, R., Karp, J., Hart, M., Groeseneken, G., Ker, M.-D., Mocuta, A., Horiguchi, N.Year:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936368
File:
PDF, 1.03 MB
english, 2017